[실험설계] Spin Coating으로 형성한 Thin Films의 표면 분석

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1. Surface analysis of thin films formed by spin coating

이 프레젠테이션은 PEDOT:PSS 박막을 스핀 코팅 방법으로 제작하고, 표면 프로파일러와 AFM을 사용하여 RPM에 따른 박막 두께와 표면 거칠기의 경향성을 분석하였습니다. 실험 결과, RPM이 낮을수록 박막 두께가 증가하고 표면 거칠기가 증가하는 것을 확인하였습니다. 또한 RPM 3000에서는 응집된 물질이 관찰되었는데, 이는 분산이 잘 되지 않았거나 기판 세척이 제대로 되지 않은 것이 원인으로 추정됩니다. 향후 계획으로는 용액상과 필름상 샘플의 PL 특성을 비교 분석할 예정입니다.

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1. Surface analysis of thin films formed by spin coating

The surface analysis of thin films formed by spin coating is an important topic in materials science and engineering. Spin coating is a widely used technique for depositing thin films on substrates, and understanding the surface properties of these films is crucial for various applications such as optoelectronics, sensors, and coatings. The surface analysis can provide valuable information about the morphology, roughness, and chemical composition of the thin films, which can help optimize the deposition process and improve the performance of the final product. Techniques like atomic force microscopy (AFM), scanning electron microscopy (SEM), and X-ray photoelectron spectroscopy (XPS) are commonly used to characterize the surface properties of spin-coated thin films. By analyzing the surface features, researchers can gain insights into the factors that influence the film formation, such as the solution properties, spin speed, and substrate characteristics. This knowledge can then be used to develop better control over the thin film deposition process and engineer surfaces with desired properties for specific applications.

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