A Wavelet-based Yarn Quality Assessment for Fabric Visual Qualities
(주)코리아스칼라
- 최초 등록일
- 2023.04.05
- 최종 저작일
- 2002.09
- 4페이지/ 어도비 PDF
- 가격 3,000원
* 본 문서는 배포용으로 복사 및 편집이 불가합니다.
서지정보
ㆍ발행기관 : 한국감성과학회
ㆍ수록지정보 : 감성과학 / 5권 / 3호
ㆍ저자명 : Joo-Yong Kim
영어 초록
Random and/or periodic defects occur in all spun yarns. These irregularities can often lead to defects in finished fabric. Yarn evenness tests are used to obtain statistical data about yarn properties, such as CV%, which is useful in comparing several sets of similar data that differ in mean value but may have some commonality in relative variation. Although this statistical data is helpful in determining relative yam quality, accurate predictions of how the yarn will appear in fabric form are still difficult to obtain. As an promising alterative, wavelet analysis has been employed to localize yarn defect so as to predict the visual qualities of the fabrics.
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